HP4155A+41501A+16058A半导体测试仪
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The Agilent / HP 4155A Semiconductor Parameter Analyzer offers high-resolution accuracy and a wide range. With the Agilent / HP 4155A Semiconductor Parameter Analyzer you can improve your semiconductor quality from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis.
Features and Specifications of the Agilent / HP 4155A Semiconductor Parameter Analyzer include:
I: 1 fA to 100 mA (20 fA offset accuracy)
V: 1 micro V to 100 V
Fully automated I-V sweep measurements with DC or Pulse Mode expandable up to 6 SMUs
Synchronized stress/measure function
Two high-voltage pulse generator units (+/- 40 V)
Time domain measurement: 60 micro s - variable intervals up to 10,001 points
Easy to use knob-sweep similar to curve tracer
Automatic analysis functions
Built-in Agilent / HP Instrument BASIC
Trigger I/Q capability
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