安捷伦 E6607C无线测试仪产品介绍：
二手、供应、回收 热线:谢先生: (微信同号)
咨询 QQ.或.邮箱: 285745767 @qq.com
东莞市金泰电子仪器有限公司
长期/供应/回收二手、网络分析仪、万用表、频谱分析仪、无线综合测试仪、蓝牙测试仪、高低频信号源、电子负载、数字存储示波器、信号发生器、函数信号发生器、标准信号源、频率计、LCR数字电桥、无线综合测试仪、直流稳压电源、手机程控电源、电容测量仪、电感测量仪、扫频信号发生器、电话分析仪、示波器校准仪、耐压测试仪,绝缘电阻测试仪、接地电阻测试仪、泄漏电流测试仪、电参数测试仪、数字功率计、PCI-GPIB卡等。
地址：广东省东莞市塘厦镇塘厦大道18号
：安捷伦
型号：E6607C无线测试仪
主要特性与技术指标
scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer measurements science
Simplify signal creation to synchronize, control, and test your wireless device with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and balancing
Integrated Multiport enables efficient Multi-DUT test
Integrated multiport provides for parallel receiver test / fast switched transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration in manufacturing
Add external display, mouse, and keyboard, for full manual control and functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
Add multi-format standards-
d calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000?, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth?, GPS/GNSS, and more
Ensure your test system is future proof due to its modern,
