LIN协议起源LIN是面向汽车底端分布式应用的低成本、低速率的串行通信总线，属于局部互联网。LIN由汽车行业开发，用作经济的子总线系统，其属于CAN的下层网络，是SAE规范的汽车A类网络，适用于对总线性能要求不高的车身系统，如车门、车窗、灯光等智能传感器、执行器的连接和控制，LIN实现了一种具有成本效益的智能传感器和执行器的通讯方式。LIN协议在汽车领域的应用LIN联盟成立于1999年，并发布了LIN1.版本。
PV023R1K1T1NHCC
PV023R1K1T1VMMC
PV023R1K1T1WMRC
PV023R9K1T1NFWS
PV023R1K1JHNMMC
PV023R1K4T1NFHS
PV023R1L1T1NMMC
PV023R1K8T1VMMC
PV023R1K1T1NFRZ
PV023R9K1T1NMMC
PV023R1K4T1NMR1
PV023R1K1T1VFDS
PV023R1K8T1NMMC
PV023R1K8T1NFWS
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PV023R1K4T1NMMC
PV023R1K1T1NKLC
PV023R1K4T1NFR1
PV023R1K1S1NFWS
PV023R1K1T1NFFC
PV023L1K1T1NFWS
PV023R1K1T1WFDS
PV023R1K1T1NFFP
PV023R1L1T1NF
PV023R1K1T1WMM1
PV023R1K1T1NHLC
PV023R1K1T1NMRZ
PV023R1K1T1NMRK
PV023R1K1T1WMMC
PV023R1K1T1NFF1
PV028R1K1T1N001
PV028R1K1T1N100
PV028R1K1T1NFDS
PV028R1K1T1NFR1
PV028R1K1T1NFHS
PV028R1K1T1NMMC
PV028R1K1T1NMM1
PV028R1K1T1NMRC
PV028R1K1T1NFWS
PV028R1K1T1NFRC
PV028R1K1T1NFF1
PV028R1K1T1WMM1
PV028R1K1T1WFR1
PV028R1K8T1NFWS
PV028R1K4T1NFR1
PV028R1K1T1VMMC
PV028R1K1T1NHCC
PV028R1K4T1NMMC
PV028R1K1T1NELC
PV028R1K1T1NHLC
PV028R1K8T1N001
PV028R1K1T1NF
PV028R9K1T1NFWS
PV028R9K1T1NMMC
PV028R1K1T1VFDS
PV028R1K1AYNMRZ
PV028R1K8T1NMMC
PV028R1K1T1NMRK
PV028R1K1T1NFFP
PV028L1K1T1NMMC
PV028R1K1T1NFRZ
PV028R1K1S1NFWS
PV028R1K1T1NMMZ
PV028R1K1T1NMR1
PV028R1K1T1NMFC
PV028R1K1T1WFDS
PV028L1K1T1NFWS
PV028R1K1JHNMMC
PV028R1K1T1NMRZ
PV028R1K4T1NFHS
PV028R1K1T1NMF1
PV028R1K1T1NGLC
PV028R1K1T1WMRC
PV028R1L1T1NMMC
PV028R1K1T1WMMC
PV028R1K1T1WMR1
PV028R1K8T1VMMC
PV028R1K1T1NFFC
PV028R1K1T1NMMK
PV028R1K4T1NMR1
PV032R1K1T1N001
PV032R1K1T1N100
PV032R1K1T1NFDS
PV032R1K1T1NFR1
PV032R1K1T1NFHS
PV032R1K1T1NMMC
PV032R1K1T1NMM1
PV032R1K1T1NMRC
PV032R1K1T1NFWS
PV032R1K1T1NFRC
PV032R1K1T1NFF1
PV032R1K1AYNMTZ
PV032R1K1T1NMFC
PV032R1K1T1NMR1
PV032R1K1T1NMF1
PV032R1K1T1NMRK
PV032R1K1T1NFFP
PV032R1K1T1WMMC
PV032R1K4T1NMMC
PV032R1K8T1VMMC
PV032R1K1T1WFR1
PV032R1K1T1NFFC
PV032R1K1JHNMMC
PV032R1K1T1WMRC
PV032R9K1T1NFWS
先测试出可控硅的峰值电压，将电线正负极连接至K两极，接地线接至室内主接地上，逐渐升压，测试其漏电流数值。进行漏电测试后，逐渐升压，观测漏电流，当数值过其额定峰值电压后，可控硅被击穿，但采用此方法可能会破坏其PN结，并且只能测试其是否导通，而不能测试其导通是否良好，故不再采用此法进行测试。摇表测试法用摇表对可控硅进行测量，参照之前使用的漏电检测法。为防止摇表法测试过程中击穿或损坏可控硅，改变摇表操作方法，即要对摇表电压和转速进行控制，两笔端链接K极对其进行测试。
