实测频谱分析仪，近场，结合恒电磁波传输小室(简称TEM小室)能作为识别辐射干扰根源的基本工具。本次测试我们采用鼎阳科技SSA3021X频谱分析仪和选配的近场以及TekBox的TEM小室。首先我们打开频谱分析仪然后设置如下：SPAN设置为530KHz到2MHz;RBW设置为9KHz，衰减设置为0dB，显示设置为电压平均;打开频谱仪标配的预置放大器，并选用正峰值检波器，测试结果如下:频谱仪基础设置在以上设置参数参考的情况下，显示平均噪声电平(DANL)大约在-20dBμV左右，这个指标在同级别的频谱仪中算是非常好的。
PV032R1K1T1NGLC
PV032R1K4T1NFHS
PV032R1K8S1NFWS
PV032R1K8T1NMMC
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PV032R1K1T1NKLC
PV040R1K8T1NMMC
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PV040R1K1T1NFFP
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PV040R1K1T1NHCC
PV040R1K1T1NMF1
PV040R1K1JHNMMC
PV040L1K1T1NMMC
PV040R1K1S1NFWS
PV040R1L1T1NMMC
PV040R1D8T1N001
PV040R1K1T1NMFC
图1生产自动化的分层模型以及对数据通信系统的要求要求对过程变量进行采集和控制的设备位于自动化的层——现场层。除了控制单元以外，还包括人机接口/终端、传感器、执行器和各种复杂的驱动系统。智能传感器、测量转换器、驱动系统和控制设备的使用也正逐渐增加。现场总线控制系统（FCS）为一种全新的分布式控制测控系统。传统的控制系统中用于连接传感器和执行器的昂贵布线在现代工厂中被串行总线系统所取代（现场总线系统、传感器－执行器－总线系统）。
PV040R1K1T1NFWS
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PV040R1K1T1NKLC
PV040R9K1T1NFWS
PV040R1K1T1NFFC
PV040R1K1T1NF
PV040R1K1T1N100
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PV040R1K1T1NGLC
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PV040R1K1T1NMLC
PV040R1D1T1NGCC
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PV040R9K1T1NMMCK0188
PV046R1K1T1N001
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PV046R1D3T1NFFC
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PV046L1K1A1NFHS
PV046R1K1B1NFDS
PV046R1D1T1NHCC
PV046R1K1T1NFFC
PV046R1K1T1NMFC
PV046R1K1T1NMF1
PV046R9K1T1NMMC
PV046R1K1AYNMRC
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PV046R9K1T1NFWS
PV046R1K4T1NMR1
PV046R1K4T1NFHS
PV046L1K1T1NFWS
PV046R1K1S1NFWS
PV046R1K1T1WFDS
PV046R1K1T1NMRZ
PV046R1K1T1EMMC
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PV046R1K1T1NFFP
PV046R1K1A4NFRC
PV046R1K1T1VFDS
PV046R1K8T1NFWS
PV046R1K1T1WMM1
PV046L1K1T1NMMC
PV046R1K8T1VMMC
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PV046R1K1T1NF
PV046R1K1AYNMRZ
PV046R1K1T1NHLC
PV046R1K1T1NMMK
PV046R1K1T1NKLC
PV046R1K1T1NMR1
PV046R1K1T1NFRZ
PV046R1K1T1WFR1
PV046R1K4T1NFR1
PV046R1K1T1WMR1
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PV046R1K1T1WMRC
PV046R1K1T1NHCC
PV046R1K1T1VMMC
PV046R1K1T1NGLC
PV046R1L1T1NMMC
PV046R1K8T1N001
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PV046R1K1T1NMMCX5934
PV063R1K1T1NMF1
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PV063R1K1T1NMMK
PV063R9L1TNMPCK0
PV063R1K1A1VFPR
PV063R1K1C1NFWS
PV063R2K1T1N001
PV063R9L1T1NFWS
PV063R1K1A1NFHS
PV063R1K1T1NFFP
PV063R1K1T1NFPR
PV063R1K1T1NGLC
PV063R1K1T1N001
PV063R1K1T1N100
PV063R1K1T1NFDS
在25℃（Tc）时有公式：恒成立。把线性降额因子设为F，则在任意温度时有：代入已知参数得到F＞5mW/℃，一般为了满足裕量要求，降额因子往往取得更大才能满足可靠性设计要求。由于小晶体管和芯片是不带散热器的，这时就要考虑壳体到空气之间的热阻。一般数据手册会给出Rja（结到环境之间的热阻）。那么三极管S8050，其功率0.625W是在其壳温25℃时取得的。倘若环境温度刚好为25℃，芯片自身又要消耗0.625W的功率，那么为了满足结点不过150℃，的办法就是让其得到足够好的散热。
