因此。汽车零部件的涡流探伤仪无损检测技术也越来越受到厂家和研究者的关注。目前，在汽车零部件的检测中，使用*广泛的无损检测方法是涡流探伤仪超声检测法。在涡流探伤仪超声探伤中使用*多的是A型超声波探伤仪。它采用A型超声显示，具有设备简单价格便宜的优点，能对缺陷和定量，在生产检验中得到广泛应用，但是其探伤结果存在不直观、无记录、探伤难、人为因素多等缺点，严重影响检测可靠性。由于计算机技术和电子器件的不断发展，使涡流探伤仪超声波信号的数字化采集和分析成为可能，波形能够记录保存，涡流探伤仪超声检测正向数字信号处理及成像方向发展。
PV063R1K1T1NFR1
PV063R1K1T1NFHS
PV063R1K1T1NMM1
PV063R1K1T1NMRC
PV063R1K1T1NFWS
PV063R1K1T1NFRC
PV063R1K1T1NFF1
PV080L1K1T1NFFC
PV080R1K1B1NSLB
PV080L1K1T1NFHS
PV080R1L1T1MULC
PV080R1K1A1NFWS
PV080R1K1T1NFRL
PV080R1K1T1NGLA
PV080R1K1T1NMMC
PV080R1L8L3NULC
PV080R1L8T1NULC
PV092R1K8T1N001
PV092R1K1T1NFRZ
PV092R1K1T1NMM1
PV092R1K1T1NMRK
PV092R1K4T1NFHS
PV092R1K1T1NKLC
PV092R1K1T1VMMC
PV092R1L1T1WTCC
PV092R1K1T1NF
PV092R1D1T1NMMC
PV092R1K1T1NGLC
PV092R1K1T1NMF1
PV092R1K1T1WFR1
PV092R1K1T1NULZ
PV092R1K1T1NHLC
PV092R1K1T1NFFC
PV092R1K1A1NFWS
PV092R1K1T1NFHS
PV092R1K1T1NFF1
PV092R1K1T1NFWS
PV092R9K1T1NMMC
PV092R1K1T1NFR1
PV092R9K1T1NFWS
PV092R1K1T1N001
PV092R1K1T1EMMC
PV092R1K1S1NFWS
PV092R1K4T1NMR1
PV092R1L1L3WTCC
PV092R1K1T1NUPM
PV092R1K8T1NMMC
PV092R1K1T1VFDS
PV092R1K1T1NMRC
PV092R1K1T1WMM1
PV092R1K1T1PFDS
PV092R1K1T1WMRC
PV092R1K1A1NMMC
PV092R1K1T1NMMC
PV092R1K8T1VMMC
PV092R1K1T1NMMK
PV092L1K1T1NFWS
PV092R1K1T1NFDS
PV092R1K1T1NKLA
PV092L1K1T1NMMC
PV092R1K4T1NFR1
PV092R1K1T1NMFC
PV092R1K1T1N100
PV092R1K8T1NFWS
PV092R1K1JHNMMC
PV092R1K4T1NMMC
PV092R1K1A4WFRZ
PV092R1K1AYNMRZ
PV092R1K1T1WFDS
PV092R1K1T1NFRC
PV092R1K1T1NHCC
PV092R1D1T1VMMC
PV092R1K1T1NMRZ
PV092R1K1T1WMR1
PV092R1K1T1WMMC
PV092R1K1T1NMR1
PV092R1L1T1NMMC
PV092R1K1T1NFFP
PV092L1K1T1N001
PV092R1D1T1NGLC
PV092R1K1T1NMLA
PV092R1K4T1NFPD
PV092R1L1T1NFPD
PV092L1K1J1NFR1
PV092R1K1A1NSLA
PV140R1K1T1NFRL
PV140L1K8T1NSLC
PV140R1K1T1NTCB
PV140R1L1A1NF
PV140L9G3B1NTCC
PV140R1K1T1NWLA
PV140R1K1T1NSCA
PV140R1D3T1VFHS
PV140L1G1T1NFFP
PV140L1K1T1NFFC
PV140L1K1T1NFFP
PV140L1K1T1NFWS
PV140L1L1T1NWCC
PV140R1D1T1NFFC
PV140R1F1T1NFHS
PV140R1F1T1NYCC
PV140R1F3T1NFFC
PV140R1F3T1NFRP
PV140R1G1T1VFFC
PV140R1K1A1NSCC
PV140R1K1B1NFWS
PV140R1K1B1NUPG
PV140R1K1T1NFDS
PV140R1K1T1NFFC
PV140R1K1T1NFFD
PV140R1K1T1NFFP
PV140R1K1T1NFF1
PV140R1K1T1NFHS
PV140R1K1T1NF
PV140R1K1T1NFRC
PV140R1K1T1NFRD
PV140R1L1T1NUPG
PV140R1L1T1NWCC
PV140R1L4T1NUPG
PV140R1K1T1NMMC
PV140R1K1T1NMRK
PV140R1K1T1NMRZ
PV140R1K1T1NULC
PV140R1K1T1NWCC
PV140R1K1T1NWLC
PV140R1K1T1WMMC
PV140R1L1T1NMMC
PV140R9K1T1NUPZ
PV140R9L1LKNWCC
PV140R9K1A1NSLCK0173
PV140R9K1T1NFDSK0186
PV140R9K1T1NFFCK0011
PV140R9K1T1NFHSK0017
PV140R9K1T1NFRCK0107
PV140R9K1T1NFWSK0032
PV140R9K1T1NFWSK0155
PV140R9K1T1NKCCK0175
PV140R9K1T1NMLCK0081
PV140R9K1T1NSLCK0003
PV140R9K1T1WSCCK0072
PV140R9K4T1NFFPK0088
PV140R9K4T1NZCBK0154
PV140R9K4T1WFRPX5918
PV140L9G1T1NFFPK0083
为了描述物理层结构的特征，还必须进行频域分析。S参数模型说明了这些数字电路结构所展示出来的模拟特点包括：不连续点反射、频率相关损耗、串扰和EMI等性能。为使设备性能符合标准，眼图增加了重要的统计分析功能。为利用特性技术改善仿真能力，可以采用基于测试结果的S参数或RLCG模型提取技术。随着在多种工作模式下进行数字和模拟综合分析（时域和频域）变得越来越重要，要完成这些测试功能，通常需要使用多种测试仪表，同时操作多种仪表正变得越来越困难。
