然而配合无线芯片原厂生产出来的模块，需要高可靠性的晶振，精密的阻容器件和电感合理的搭配来处理射频干扰，特别是在天线端的分立器件匹配端需要有丰富的射频设计经验和模拟设计功底。即便是现行批量生产的无线模块，也要在产品的应用端来考虑模块尺寸的大小是否符合和满足日趋小型化的产品，另外在产品的距离和功耗方面是否处理的得当，而且每家模块厂商都会有自己的技术指标评判标准，产品的一致性方面更是难以从生产角度得到有效的保障。
PV063R1K1T1NFR1
PV063R1K1T1NFHS
PV063R1K1T1NMM1
PV063R1K1T1NMRC
PV063R1K1T1NFWS
PV063R1K1T1NFRC
PV063R1K1T1NFF1
PV080L1K1T1NFFC
PV080R1K1B1NSLB
PV080L1K1T1NFHS
PV080R1L1T1MULC
PV080R1K1A1NFWS
PV080R1K1T1NFRL
PV080R1K1T1NGLA
PV080R1K1T1NMMC
PV080R1L8L3NULC
PV080R1L8T1NULC
PV092R1K8T1N001
PV092R1K1T1NFRZ
PV092R1K1T1NMM1
PV092R1K1T1NMRK
PV092R1K4T1NFHS
PV092R1K1T1NKLC
PV092R1K1T1VMMC
PV092R1L1T1WTCC
PV092R1K1T1NF
PV092R1D1T1NMMC
PV092R1K1T1NGLC
PV092R1K1T1NMF1
PV092R1K1T1WFR1
PV092R1K1T1NULZ
PV092R1K1T1NHLC
PV092R1K1T1NFFC
PV092R1K1A1NFWS
PV092R1K1T1NFHS
PV092R1K1T1NFF1
PV092R1K1T1NFWS
PV092R9K1T1NMMC
PV092R1K1T1NFR1
PV092R9K1T1NFWS
PV092R1K1T1N001
PV092R1K1T1EMMC
PV092R1K1S1NFWS
PV092R1K4T1NMR1
PV092R1L1L3WTCC
PV092R1K1T1NUPM
PV092R1K8T1NMMC
PV092R1K1T1VFDS
PV092R1K1T1NMRC
PV092R1K1T1WMM1
PV092R1K1T1PFDS
PV092R1K1T1WMRC
PV092R1K1A1NMMC
PV092R1K1T1NMMC
PV092R1K8T1VMMC
PV092R1K1T1NMMK
PV092L1K1T1NFWS
PV092R1K1T1NFDS
PV092R1K1T1NKLA
PV092L1K1T1NMMC
PV092R1K4T1NFR1
PV092R1K1T1NMFC
PV092R1K1T1N100
PV092R1K8T1NFWS
PV092R1K1JHNMMC
PV092R1K4T1NMMC
PV092R1K1A4WFRZ
PV092R1K1AYNMRZ
PV092R1K1T1WFDS
PV092R1K1T1NFRC
PV092R1K1T1NHCC
PV092R1D1T1VMMC
PV092R1K1T1NMRZ
PV092R1K1T1WMR1
PV092R1K1T1WMMC
PV092R1K1T1NMR1
PV092R1L1T1NMMC
PV092R1K1T1NFFP
PV092L1K1T1N001
PV092R1D1T1NGLC
PV092R1K1T1NMLA
PV092R1K4T1NFPD
PV092R1L1T1NFPD
PV092L1K1J1NFR1
PV092R1K1A1NSLA
PV140R1K1T1NFRL
PV140L1K8T1NSLC
PV140R1K1T1NTCB
PV140R1L1A1NF
PV140L9G3B1NTCC
PV140R1K1T1NWLA
PV140R1K1T1NSCA
PV140R1D3T1VFHS
PV140L1G1T1NFFP
PV140L1K1T1NFFC
PV140L1K1T1NFFP
PV140L1K1T1NFWS
PV140L1L1T1NWCC
PV140R1D1T1NFFC
PV140R1F1T1NFHS
PV140R1F1T1NYCC
PV140R1F3T1NFFC
PV140R1F3T1NFRP
PV140R1G1T1VFFC
PV140R1K1A1NSCC
PV140R1K1B1NFWS
PV140R1K1B1NUPG
PV140R1K1T1NFDS
PV140R1K1T1NFFC
PV140R1K1T1NFFD
PV140R1K1T1NFFP
PV140R1K1T1NFF1
PV140R1K1T1NFHS
PV140R1K1T1NF
PV140R1K1T1NFRC
PV140R1K1T1NFRD
PV140R1L1T1NUPG
PV140R1L1T1NWCC
PV140R1L4T1NUPG
PV140R1K1T1NMMC
PV140R1K1T1NMRK
PV140R1K1T1NMRZ
PV140R1K1T1NULC
PV140R1K1T1NWCC
PV140R1K1T1NWLC
PV140R1K1T1WMMC
PV140R1L1T1NMMC
PV140R9K1T1NUPZ
PV140R9L1LKNWCC
PV140R9K1A1NSLCK0173
PV140R9K1T1NFDSK0186
PV140R9K1T1NFFCK0011
PV140R9K1T1NFHSK0017
PV140R9K1T1NFRCK0107
PV140R9K1T1NFWSK0032
PV140R9K1T1NFWSK0155
PV140R9K1T1NKCCK0175
PV140R9K1T1NMLCK0081
PV140R9K1T1NSLCK0003
PV140R9K1T1WSCCK0072
PV140R9K4T1NFFPK0088
PV140R9K4T1NZCBK0154
PV140R9K4T1WFRPX5918
PV140L9G1T1NFFPK0083
无论是实验室环境还是生产车间，都需要采用更的半导体测试方法。半导体测试是NI的战略重点。我们正在扩展我们的软件平台和PXI功能，以帮助芯片制造商应对他们面临的挑战，这一点通过NI的PXISMU可以完全体现出来。”由于其高吞吐量、高和占地面积小，NI的半导体测试系统(STS)正在快速应用到芯片生产中。全新的PXIe-4163SMU则进一步增强了这些功能，它能提供更高的直流通道密度，使多站点应用具有更高的并行性，以及在生产中提供实验室级别的测量质量。
