PV016R1K1AYN100
PV016R1K1T1NMMC
PV016R1L1T1NFDS
PV016R1K1T1NELB
PV016R1K1T1NECC
PV016R1K1T1NFFD
PV016R1K1T1NFRC
PV016R1K1T1N001
PV016R1K1T1N100
PV016R1K1T1NFDS
PV016R1K1T1NFR1
PV016R1K1T1NFHS
PV016R1K1T1NMM1
PV016R1K1T1NMRC
PV016R1K1T1NFWS
PV016R1K1T1NFF1
PV020R1K1T1N001
PV020R1K1T1N100
PV020R1K1T1NFDS
PV020R1K1T1NFR1
PV020R1K1T1NFHS
PV020R1K1T1NMMC
PV020R1K1T1NMM1
PV020R1K1T1NMRC
PV020R1K1T1NFWS
PV020R1K1T1NFRC
PV020R1K1T1NFF1
PV020R1K1T1NHLC
PV020R1K1T1WMM1
PV020R1K1T1NBLC
PV020R1K1T1NFRL
PV020L1K1T1NFWS
PV020R1K4T1NFR1
PV020R1K1AYNMMC
PV020R1K8T1VMMC
PV020R1K1T1NMR1
PV020R1K1T1NFRZ
PV020R1K4T1NFHS
PV020R1K1A1NMMC
PV020R1K1T1NMMK
PV020R1K1T1NKLC
PV020R1K1T1NMF1
PV020R1K1T1WFDS
PV020R1K1T1WFR1
PV020R1K1T1WMMC
PV020R1K1T1NMRZ
PV020R1K1T1WMRC
PV020R1K1T1NF
PV020R1K1T1NFFP
PV020R1K1JHNMMC
PV020R1K8T1NFWS
PV020R1K1AYNMRZ
PV020R1K1T1VMMC
PV020R1K1T1WMR1
PV020R1K4T1NMR1
PV020R1K1T1NHCC
PV020R9K1T1NMMC
PV020R1K8T1NMMC
PV020R1K8T1N001
PV020R1K1T1NFFC
PV020R1K4T1NMMC
PV020R1L1T1NMMC
PV020L1K1T1NMMC
PV020R1K1S1NFWS
PV020R1K1T1NGLC
PV020R1K1T1NMRK
PV020R1K1T1VFDS
PV023R1K1T1N001
PV023R1K1T1N100
PV023R1K1T1NFDS
PV023R1K1T1NFR1
PV023R1K1T1NFHS
PV023R1K1T1NMMC
PV023R1K1T1NMM1
PV023R1K1T1NMRC
PV023R1K1T1NFWS
PV023R1K1T1NFRC
PV023R1D1T1NMMC
PV023R1D1T1NUPR
PV023R1D3T1NMMW
PV023R1E1T1NMFC
PV023R1E1T1NUPR
PV023R1K1AYNMMC
PV023R1K1AYNMMD
PV023R1K1AYNMMW
PV023R1K1AYNMRC
PV023R1K1AYNMR1
PV023R1K1A1NECC
PV023R1K1T1NCCC
PV023R1K1T1NCLC
PV023R1K1T1NDCC
PV023R1K1T1NDCD
PV023R1K1T1NDLC
PV023R1K1T1NDLD
PV023R1K1T1NDL1
PV023R1E1T1NGLC
PV023R1K8T1VFHS
PV023R1K1A1NFWS
PV023R1L1T1NFRC
PV023R1L1T1NCLC
PV023R1K1T1NBCC
PV023R1K1T1NF
程控测量放大器比测量放大器增加了模拟开关及驱动电路。增益选择开关Sl—S'l，S2—S'2，S3—S'3成对动作，每一时刻仅有一对开关闭合，当改变数字量输入编码时，则可改变闭合的开关号，选择不同的反馈电阻，相当于自动改变测量放大器中电位器R1的阻值，达到改变放大器增益的目的。下图为集成程控测量放大器电路芯片LH0084的内部电路原理图。一方面通过接线选择运算放大器A3的反馈电阻来确定放大器的基础放大倍数，另一方面通过控制模拟开关实现放大倍数的自动控制。
PV023R1K1T1NECC
PV023R1K1T1NELC
PV023R1K1T1NEL1
PV023R1K1T1NGCC
PV023R1K1T1NGLC
PV023R1K1T1NGL1
PV023R1K1T1NMFC
PV023R1K1T1NMFW
PV023R1K1T1NMF1
PV023R1K1T1NMMD
PV023R1K1T1NMMW
PV023R1K1T1NMRD
PV023R1K1T1NMR1
PV023R1K1T1NUPD
PV023R1K1T1NUPE
PV023R1K1T1NMMK
PV023R1K1AYNMRZ
PV023R1K1T1WFR1
复杂系统的调试和验证面临许多测试技术挑战，包括捕获和可视化多个不频繁或间断出现的事件，如串行数据包、激光脉冲和故障信号。为了准确测量和表征这些信号，必须在长时间内高采样率捕获它们。示波器的默认采集模式因为其有限的记录长度会强制在采样率和捕获时间进行妥协。使用更高的采样率可以更快地填充仪器的内存，减少数据采集的时间窗口。相反，捕获长时间的数据通常是以牺牲水平时间分辨率(采样率)为代价的。分段存储架构FastFrameTM分段存储允许将内存分割成多帧。
