Model

3252

Main Function

Transformer Scanning Test         Transformer Scanning Test + LCR METER

Test Parameter

Transformer Scanning   Turn Ratio, Phase, Turn, L, Q, Leakage L, Balance, ACR, Cp, DCR, Pin Short

LCR METER   --      L, C, R, |Z|, Y, DCR, Q, D, R, X,

Test Signals Information

Test Level  Turn 10mV ~ 10V, 10% 10mV/step

Others    10mV ~ 2V, 10% 10mV/step

Test Frequency   Turn 1kHz ~ 200kHz, 0.002%,              20Hz~1MHz, 0.002%, Resolution: 0.01 Hz

Output Impedance   Turn 10 , when level 2V / 50 , when level<2V

Others Constant = OFF : Varies as range resistors

Constant = 320X : 100Ω±5%

Constant = 107X : 25Ω±5%

Constant = 106X : 10Ω±5%

Measurement Range

L, LK :  0.00001uH ~ 9999.99H

C :     0.00001pF ~ 999.999mF

Q, D:    0.00001 ~ 99999

Z, X, R:  0.00001 ~ 99.9999M

Y :     0.01nS ~ 99.9999S

θ:    -90.00°~ +90.00°

DCR:     0.001mΩ~ 99.999M

Turn :    0.01 ~ 99999.99 turns (Secondary voltage less than 100 Vrms)

Pin-Short :11 pairs, between pin to pin

Basic Accuracy

L, LK, C, Z, X, Y, R, DCR       0.1%(1kHz if AC parameter)

Q, D   0.0005(1kHz)

0.03 (1kHz)

Turn    0.5% (1kHz)

Measurement Speed (Fastest)

L, LK, C, Z, X, Y, R, Q, D,  80meas./sec.

DCR  50meas./sec.

Turn  10meas./sec.

Judge

Transformer Scanning   PASS/FAIL judge of all test parameters output from optional HANDLER interface

LCR METER--                               10 bins for sorting & bin sum count output from

HANDLER interface/PASS/FAIL judge output from HANDLER interface

Trigger                     Internal, Manual, External

Display                    320x240 dot-matrix LCD display

Equivalent Circuit Mode   Series, Parallel

Correction Function       Open/Short Zeroing, Load correction

Memory    15 instrument setups, expansion is possible via memory card

General

Operation Environment   Temperature: 10°C ~ 40°C, Humidity: 10% ~ 90% RH

Power consumption       140VA max

Dimension(H*W*D)        177*430*300mm                   

Weight                    about 9.2kg