基于VXI总线的多功能边界扫描控制器

基于VXI总线的多功能边界扫描控制器
赵文彦，杜 影， 徐凌辉
（北京航天测控技术开发公司，北京 100037）

摘要：根据系统级边界扫描测试技术的应用需求，基于VXI总线的多功能边界扫描测试控制器具备三种操作模式：IEEE1149.1 TAP模式、IEEE1149.5主控制器模式和从控制器模式。由上位机控制模件组态到期望的模式，模件上的TAP口控制器产生1149.1测试信号，提供给JTAG口用于通过TDO/TDI扫描链对被测目标板进行边界扫描测试。IEEE1149.5主控制器可完成和从控制器间的通讯以便对机箱或子系统级中可测试性模件进行边界扫描测试。兼容于BSDL和EDIF文件格式的自动测试向量生成软件可实现多种扫描测试功能。
关键词：边界扫描测试；MTM总线；TAP口；测试向量生成；
Multifunction Boundary Scan Controller Based on VXI_BUS
              Zhao wenyan Du ying Xu linghui
      (Beijing Aerospace Measurement & Control Corp Beijing  100037 China)
Abstract: According to the requirement of Boundary Scan Test technique in systems the multifunction boundary scan controller d on VXI bus is designed which has three kind of operators: TAP controller d on IEEE Std 1149.1 MTM-bus master controller and MTM-bus slave controller d on IEEE Std 1149.5. The host selects the operator schema the TAP controller generates the 1149.1 test signals applied to test chains on a board through JTAG port. The master controller can be used to communicate with the slave controller implementing boundary scan test of testable subsystems. The automatic testing software which is compatible with BSDL files and EDIF files can complete multiple boundary scan test tasks.
  Key words: boundary scan test; MTM-Bus; TAP port ; test vector generation