20世纪80年代开始，非制冷红外焦平面阵列探测器在美国军方支持下发展起来的，在1992年全部研发完成后才对布。初期技术路线包括德州仪器研制的BST热释电探测器和霍尼韦尔研制的氧化钒（VOx）微测辐射热计探测器。后来由于热释电技术本身的一些局限性，微测辐射热计探测器逐渐胜出。2009年，L-3公司*终宣布停止继续生产热释电探测器。之后，法国的CEA/LETI以及德州仪器公司又分别研制了非晶硅（a-Si）微测辐射热计探测器。
PV063R1K1T1NFR1
PV063R1K1T1NFHS
PV063R1K1T1NMM1
PV063R1K1T1NMRC
PV063R1K1T1NFWS
PV063R1K1T1NFRC
PV063R1K1T1NFF1
PV080L1K1T1NFFC
PV080R1K1B1NSLB
PV080L1K1T1NFHS
PV080R1L1T1MULC
PV080R1K1A1NFWS
PV080R1K1T1NFRL
PV080R1K1T1NGLA
PV080R1K1T1NMMC
PV080R1L8L3NULC
PV080R1L8T1NULC
PV092R1K8T1N001
PV092R1K1T1NFRZ
PV092R1K1T1NMM1
PV092R1K1T1NMRK
PV092R1K4T1NFHS
PV092R1K1T1NKLC
PV092R1K1T1VMMC
PV092R1L1T1WTCC
PV092R1K1T1NF
PV092R1D1T1NMMC
PV092R1K1T1NGLC
PV092R1K1T1NMF1
PV092R1K1T1WFR1
PV092R1K1T1NULZ
PV092R1K1T1NHLC
PV092R1K1T1NFFC
PV092R1K1A1NFWS
PV092R1K1T1NFHS
PV092R1K1T1NFF1
PV092R1K1T1NFWS
PV092R9K1T1NMMC
PV092R1K1T1NFR1
PV092R9K1T1NFWS
PV092R1K1T1N001
PV092R1K1T1EMMC
PV092R1K1S1NFWS
PV092R1K4T1NMR1
PV092R1L1L3WTCC
PV092R1K1T1NUPM
PV092R1K8T1NMMC
PV092R1K1T1VFDS
PV092R1K1T1NMRC
PV092R1K1T1WMM1
PV092R1K1T1PFDS
PV092R1K1T1WMRC
PV092R1K1A1NMMC
PV092R1K1T1NMMC
PV092R1K8T1VMMC
PV092R1K1T1NMMK
PV092L1K1T1NFWS
PV092R1K1T1NFDS
PV092R1K1T1NKLA
PV092L1K1T1NMMC
PV092R1K4T1NFR1
PV092R1K1T1NMFC
PV092R1K1T1N100
PV092R1K8T1NFWS
PV092R1K1JHNMMC
PV092R1K4T1NMMC
PV092R1K1A4WFRZ
PV092R1K1AYNMRZ
PV092R1K1T1WFDS
PV092R1K1T1NFRC
PV092R1K1T1NHCC
PV092R1D1T1VMMC
PV092R1K1T1NMRZ
PV092R1K1T1WMR1
PV092R1K1T1WMMC
PV092R1K1T1NMR1
PV092R1L1T1NMMC
PV092R1K1T1NFFP
PV092L1K1T1N001
PV092R1D1T1NGLC
PV092R1K1T1NMLA
PV092R1K4T1NFPD
PV092R1L1T1NFPD
PV092L1K1J1NFR1
PV092R1K1A1NSLA
PV140R1K1T1NFRL
PV140L1K8T1NSLC
PV140R1K1T1NTCB
PV140R1L1A1NF
PV140L9G3B1NTCC
PV140R1K1T1NWLA
PV140R1K1T1NSCA
PV140R1D3T1VFHS
PV140L1G1T1NFFP
PV140L1K1T1NFFC
PV140L1K1T1NFFP
PV140L1K1T1NFWS
PV140L1L1T1NWCC
PV140R1D1T1NFFC
PV140R1F1T1NFHS
PV140R1F1T1NYCC
PV140R1F3T1NFFC
PV140R1F3T1NFRP
PV140R1G1T1VFFC
PV140R1K1A1NSCC
PV140R1K1B1NFWS
PV140R1K1B1NUPG
PV140R1K1T1NFDS
PV140R1K1T1NFFC
PV140R1K1T1NFFD
PV140R1K1T1NFFP
PV140R1K1T1NFF1
PV140R1K1T1NFHS
PV140R1K1T1NF
PV140R1K1T1NFRC
PV140R1K1T1NFRD
PV140R1L1T1NUPG
PV140R1L1T1NWCC
PV140R1L4T1NUPG
PV140R1K1T1NMMC
PV140R1K1T1NMRK
PV140R1K1T1NMRZ
PV140R1K1T1NULC
PV140R1K1T1NWCC
PV140R1K1T1NWLC
PV140R1K1T1WMMC
PV140R1L1T1NMMC
PV140R9K1T1NUPZ
PV140R9L1LKNWCC
PV140R9K1A1NSLCK0173
PV140R9K1T1NFDSK0186
PV140R9K1T1NFFCK0011
PV140R9K1T1NFHSK0017
PV140R9K1T1NFRCK0107
PV140R9K1T1NFWSK0032
PV140R9K1T1NFWSK0155
PV140R9K1T1NKCCK0175
PV140R9K1T1NMLCK0081
PV140R9K1T1NSLCK0003
PV140R9K1T1WSCCK0072
PV140R9K4T1NFFPK0088
PV140R9K4T1NZCBK0154
PV140R9K4T1WFRPX5918
PV140L9G1T1NFFPK0083
所谓源测量单元(SourceMeasureUnit，简称SMU)，顾名思义就是可编程电源和测量仪表的结合体，既可以有电源输出，又可以进行测量。随着应用领域对供给电源和测量同步性要求的不断提高，SMU在生物化学、导材料、光电器件测试、半导体研究等领域起到了越来越大的作用。尤其是高性能的源表，可以更地检测器件特性，提升整个测试系统的效率，从而提高设计和生产效率。横河测试测量公号之前的推文介绍了源测量单元SMU一些重要的性能指标。
