由Eq.1可以看出，试件表面的温度响应与试件厚度L有关。当脉冲线热源激励在薄板上时，由于盲孔缺陷处的L值减小，盲孔缺陷处表面温度的幅值会增大，且根据matlab模拟得出结论，温度的衰减也会慢于正常区域。进行Abaqus模拟后，得出结论：当线热源扫描至缺陷位置时，在缺陷处温度突然升高，高于无缺陷处的位置；当线热源扫描过缺陷后，在缺陷处的热图像上发生明显高温处的温度拖拽现象。针对在粗扫检测阶段发现的排除噪音后温度疑似缺陷的微区域，在细扫描阶段的检测原理中，在该微区域内进行提高功率的快速细扫描，将快速扫描的线激光近似看作为面激光脉冲加热。
PV023R1K1T1NHCC
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PV023R1K1T1WMM1
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PV028R1K1T1N001
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PV028R1K1T1NFWS
PV028R1K1T1NFRC
PV028R1K1T1NFF1
PV028R1K1T1WMM1
PV028R1K1T1WFR1
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PV028R1K4T1NFR1
PV028R1K1T1VMMC
PV028R1K1T1NHCC
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PV028R1K1T1NHLC
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PV028R1K1T1NF
PV028R9K1T1NFWS
PV028R9K1T1NMMC
PV028R1K1T1VFDS
PV028R1K1AYNMRZ
PV028R1K8T1NMMC
PV028R1K1T1NMRK
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PV028R1K1T1WFDS
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PV028R1K1JHNMMC
PV028R1K1T1NMRZ
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PV028R1L1T1NMMC
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PV032R1K1T1NFDS
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PV032R1K1T1NFF1
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PV032R1K1T1NMFC
PV032R1K1T1NMR1
PV032R1K1T1NMF1
PV032R1K1T1NMRK
PV032R1K1T1NFFP
PV032R1K1T1WMMC
PV032R1K4T1NMMC
PV032R1K8T1VMMC
PV032R1K1T1WFR1
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PV032R9K1T1NFWS
电气参数的受控变换，使得“率用电和高品质用电相结合”的目标正在一步步成为现实。当前，电力电子技术作为节能、节材、自动化、智能化、机电一体化的基础，正朝着应用技术高频化、硬件结构模块化、产品性能绿色化的方向发展。在不远的将来，电力电子技术将使传动装置、电源技术更加成熟、经济、实用。当代应用科学的许多新发展都与电力电子技术紧密联在一起，特别是和功率控制系统联系在一起，如电气传动、通讯电源、变频调速、机车牵引、电力输送、电动汽车、储能电池，以及日新月异的基于高速数据处理的个人电脑和通讯设备等，如果没有电力电子功率控制做支持，这些新技术的进步就难以实现。
