
PV016R1K1AYN100
PV016R1K1T1NMMC
PV016R1L1T1NFDS
PV016R1K1T1NELB
PV016R1K1T1NECC
PV016R1K1T1NFFD
PV016R1K1T1NFRC
PV016R1K1T1N001
PV016R1K1T1N100
PV016R1K1T1NFDS
PV016R1K1T1NFR1
PV016R1K1T1NFHS
PV016R1K1T1NMM1
PV016R1K1T1NMRC
PV016R1K1T1NFWS
PV016R1K1T1NFF1
PV020R1K1T1N001
PV020R1K1T1N100
PV020R1K1T1NFDS
PV020R1K1T1NFR1
PV020R1K1T1NFHS
PV020R1K1T1NMMC
PV020R1K1T1NMM1
PV020R1K1T1NMRC
PV020R1K1T1NFWS
PV020R1K1T1NFRC
PV020R1K1T1NFF1

PV020R1K1T1NHLC
PV020R1K1T1WMM1
PV020R1K1T1NBLC
PV020R1K1T1NFRL
PV020L1K1T1NFWS
PV020R1K4T1NFR1
PV020R1K1AYNMMC
PV020R1K8T1VMMC
PV020R1K1T1NMR1
PV020R1K1T1NFRZ
PV020R1K4T1NFHS
PV020R1K1A1NMMC
PV020R1K1T1NMMK
PV020R1K1T1NKLC
PV020R1K1T1NMF1
PV020R1K1T1WFDS
PV020R1K1T1WFR1
PV020R1K1T1WMMC
PV020R1K1T1NMRZ
PV020R1K1T1WMRC
PV020R1K1T1NF
PV020R1K1T1NFFP
PV020R1K1JHNMMC
PV020R1K8T1NFWS
PV020R1K1AYNMRZ
PV020R1K1T1VMMC
PV020R1K1T1WMR1
PV020R1K4T1NMR1
PV020R1K1T1NHCC
PV020R9K1T1NMMC
PV020R1K8T1NMMC
PV020R1K8T1N001
PV020R1K1T1NFFC
PV020R1K4T1NMMC
PV020R1L1T1NMMC
PV020L1K1T1NMMC
PV020R1K1S1NFWS
PV020R1K1T1NGLC
PV020R1K1T1NMRK
PV020R1K1T1VFDS
PV023R1K1T1N001

PV023R1K1T1N100
PV023R1K1T1NFDS
PV023R1K1T1NFR1
PV023R1K1T1NFHS
PV023R1K1T1NMMC
PV023R1K1T1NMM1
PV023R1K1T1NMRC
PV023R1K1T1NFWS
PV023R1K1T1NFRC
PV023R1D1T1NMMC
PV023R1D1T1NUPR
PV023R1D3T1NMMW
PV023R1E1T1NMFC
PV023R1E1T1NUPR
PV023R1K1AYNMMC
PV023R1K1AYNMMD
PV023R1K1AYNMMW
PV023R1K1AYNMRC
PV023R1K1AYNMR1
PV023R1K1A1NECC
PV023R1K1T1NCCC
PV023R1K1T1NCLC
PV023R1K1T1NDCC
PV023R1K1T1NDCD
PV023R1K1T1NDLC
PV023R1K1T1NDLD
PV023R1K1T1NDL1
PV023R1E1T1NGLC
PV023R1K8T1VFHS
PV023R1K1A1NFWS
PV023R1L1T1NFRC
PV023R1L1T1NCLC
PV023R1K1T1NBCC
PV023R1K1T1NF
升温速率的影响和选择升温速率不仅影响峰温的位置,而且影响峰面积的大小,一般来说,在较快的升温速率下峰面积变大,峰变尖锐。但是快的升温速率使试样分解偏离平衡条件的程度也大,因而易使基线漂移。更主要的可能导致相邻两个峰重叠,分辨力下降。较慢的升温速率,基线漂移小,使体系接近平衡条件,得到宽而浅的峰,也能使相邻两峰更好地分离,因而分辨力高。但测定时间,需要仪器的灵敏度高。一般情况下选择8度min-1~12度min-1为宜。
PV023R1K1T1NECC
PV023R1K1T1NELC
PV023R1K1T1NEL1
PV023R1K1T1NGCC
PV023R1K1T1NGLC
PV023R1K1T1NGL1
PV023R1K1T1NMFC
PV023R1K1T1NMFW
PV023R1K1T1NMF1
PV023R1K1T1NMMD
PV023R1K1T1NMMW
PV023R1K1T1NMRD
PV023R1K1T1NMR1
PV023R1K1T1NUPD
PV023R1K1T1NUPE
PV023R1K1T1NMMK
PV023R1K1AYNMRZ
PV023R1K1T1WFR1

MPT1000电机测试平台对于堵转电流测试,有一套完整的方案。堵转测试分为常规堵转测试和国标堵转测试。常规堵转测试,是经市场检验的易于使用和愿意接受的方案,过程简单,成本较低。当设备准备就绪后,给被测电机以额定电压,使其运行在空载状态下,运行稳定后给电机加载并逐渐增加负载,直至被测电机转速降低并堵转;或者采用MPT电机测试系统为客户定制的堵转件直接将电机堵转,再给电机施加额定电压。在电机停转的短时间内,利用高速、高精度数据采集系统采集被测电机的扭矩、电压、电流等数据并计算得出关于电机的测量参数和计算参数,并通过功率分析仪和工控机显示在屏幕上并储存下来,所存储的数据均可方便导出和打印,大大方便电机堵转数据的分析。